APA Style
PENZA, PIETRO, BANSAL, VIPUL K.. (2001).
MEASURING MARKET RISK WITH VALUE AT RISK .
New York:
John Wiley & Sons.
Chicago Style
PENZA, PIETRO, BANSAL, VIPUL K..
MEASURING MARKET RISK WITH VALUE AT RISK.
New York:
John Wiley & Sons,
2001.
Text.
MLA Style
PENZA, PIETRO, BANSAL, VIPUL K..
MEASURING MARKET RISK WITH VALUE AT RISK.
New York:
John Wiley & Sons,
2001.
Text.
Turabian Style
PENZA, PIETRO, BANSAL, VIPUL K..
MEASURING MARKET RISK WITH VALUE AT RISK.
New York:
John Wiley & Sons,
2001.
Print.